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Thin film formation manner of the ultraviolet ray hardening die adhesive and normal temperature lamination manner null of three dimensions LSI which use
Thin film formation manner of the ultraviolet ray hardening die adhesive and normal temperature lamination manner null of three dimensions LSI which use
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机译:所使用的三维LSI的紫外线固化型胶粘剂的薄膜形成方式和常温层压方式无效
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摘要
PURPOSE: To provide a method for forming a thin film of a UV-curing adhesive and to provide the room-temperature stacking method for a three-dimensional LSI using it. ;CONSTITUTION: When an adhesive film is formed on a substratum silicon wafer, a thin film is formed on the substratum silicon wafer 11 by spin-coating a UV-curing adhesive, the adhesive is irradiated with ultraviolet rays anal hardened, and a substratum adhesive layer 23 is formed. Then, a (liquid) upper-part adhesive layer 24a is formed on the substratum adhesive layer 23 by newly spin-coating an adhesive. After that, a silicon wafer, for alignment, which is provided with a UV-transmitting part is overlapped, and it is positioned and compression-bonded. After that, ultraviolet rays 22 are irradiated via a UV- transmitting member 25 which has been formed on the silicon wafer for alignment, and a three-dimensional LSI is stacked at room temperature via a (solid) upper-part adhesive layer 24b formed by hardening the (liquid) upper-part adhesive layer 24a.;COPYRIGHT: (C)1994,JPO&Japio
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