In the electronic parts the performance survey instrument

摘要

PURPOSE: To prevent that an electronic component whose high temperature performance is unacceptable is judged to be acceptable by normal temperature inspection, by cutting short, before normal temperature inspection, the lead terminal of the electronic component whose high temperature performance is judged to be unacceptable, in order not to come into contact with a probe for normal temperature inspection. ;CONSTITUTION: Both lead frames A₁, A₂ provided with a plurality of photo interrupters are engaged with a bearer 7a of a probe unit 7 for high temperature inspection and supplied. In this state, the performance at a high temperature is inspected. Next, both of the lead frames A₁, A₂ are engaged with a die mold and supplied. By using a cutter, a lead terminal 3a which is judged to be unacceptable by high temperature inspection is cut short. Then both of the lead frames A₁, A₂ are engaged with the bearer of a probe unit for normal temperature inspection and supplied. In this state, the performance at a normal temperature is inspected. Thereby the probe is prevented from coming into contact with the lead terminal 3a, and it can be prevented that the photo interrupter 1 which is judged to be unacceptable by high temperature inspection is judged to be acceptable.;COPYRIGHT: (C)1993,JPO&Japio