首页> 外国专利> ILLUMINATING DEVICE FOR MEASURING UNEVENNESS, UNEVENNESS MEASURING DEVICE, ILLUMINATING DEVICE FOR INSPECTING DEFECT, DEFECT INSPECTION DEVICE AND ILLUMINATING METHOD THEREFOR

ILLUMINATING DEVICE FOR MEASURING UNEVENNESS, UNEVENNESS MEASURING DEVICE, ILLUMINATING DEVICE FOR INSPECTING DEFECT, DEFECT INSPECTION DEVICE AND ILLUMINATING METHOD THEREFOR

机译:用于测量不平度的照明装置,用于测量缺陷的不平度测量装置,用于检查缺陷的照明装置,缺陷检查装置及其照明方法

摘要

PROBLEM TO BE SOLVED: To provide an illuminating device for inspecting a defect capable of discriminating a three-dimensional defect like a pit, a dent or the like from a two-dimensional defect based on variation in reflectivity. ;SOLUTION: In this illuminating device for inspecting a defect, in imaging a CCL2 by a line sensor camera 4, and inspecting a defect according to an image pickup signal, an image pickup surface 3 imaged by the line sensor camera 4 is illuminated. The illuminating device 50 is constituted by plural light sources 51 to 53, the respective light sources 51 to 53 are disposed to be different in illuminating configuration of the light sources 51 to 53, and illumination of the light sources 51 to 53 is switched according to the image pickup timing of the line sensor camera 4.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:提供一种用于检查缺陷的照明装置,该照明装置能够基于反射率的变化将诸如凹坑,凹痕等的三维缺陷与二维缺陷区分开。 ;解决方案:在该用于检查缺陷的照明装置中,在通过线传感器照相机4对CCL2成像并且根据图像拾取信号检查缺陷时,对由线传感器照相机4成像的图像拾取表面3进行照明。照明装置50由多个光源51至53构成,各个光源51至53被布置为在光源51至53的照明配置上不同,并且光源51至53的照明根据线传感器摄像机4.的图像拍摄时间;版权:(C)2001,JPO

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