首页> 外国专利> METHOD FOR PRODUCING GROUP III NITRIDE SEMICONDUCTOR, METHOD FOR PRODUCING GROUP III NITRIDE LIGHT EMISSION ELEMENT, AND GROUP III NITRIDE LIGHT EMISSION ELEMENT

METHOD FOR PRODUCING GROUP III NITRIDE SEMICONDUCTOR, METHOD FOR PRODUCING GROUP III NITRIDE LIGHT EMISSION ELEMENT, AND GROUP III NITRIDE LIGHT EMISSION ELEMENT

机译:第III族氮化物半导体的制造方法,第III族氮化物发光元件的制造方法以及第III族氮化物发光元件

摘要

PROBLEM TO BE SOLVED: To improve crystallinity of AlGaN layer. ;SOLUTION: Clad layers 404 and 408 of group III nitride semiconductor laser are each formed of In-doped Al0.1Ga0.9N having 1 μm thickness, in which In is introduced at 100°C growth temperature. Crystallinity of AlGaN layer is improved by dope of In. Thereby, group III nitride semiconductor laser having good crystallinity and thick clad layer can be produced while making infuence exerted to band gap negligibly small and enables single and lateral mode oscillation and makes threshold electric current small.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:改善AlGaN层的结晶度。 ;解决方案:III族氮化物半导体激光器的包层404和408均由具有1μm厚度的In掺杂的Al0.1Ga0.9N形成,其中在100℃的生长温度下引入In。通过掺杂In可以提高AlGaN层的结晶度。从而,可以制造出具有良好结晶性和厚覆层的III族氮化物半导体激光器,同时对带隙的影响可以忽略不计,并且能够进行单向和横向模式振荡,并且使阈值电流减小。; COPYRIGHT:(C)2001,JPO

著录项

  • 公开/公告号JP2001097800A

    专利类型

  • 公开/公告日2001-04-10

    原文格式PDF

  • 申请/专利权人 TOYOTA CENTRAL RES & DEV LAB INC;

    申请/专利号JP19990280215

  • 发明设计人 KACHI TORU;

    申请日1999-09-30

  • 分类号C30B29/38;H01L33/00;H01S5/323;

  • 国家 JP

  • 入库时间 2022-08-22 01:27:27

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