AUTOMATIC HANDLER FOR IC TEST SYSTEM, TEST TRAY STOPPING MECHANISM AND TEST TRAY TRANSFERRING METHOD FOR AUTOMATIC HANDLER OF IC TEST SYSTEM

摘要

PURPOSE: in stop position, to increase, an interior, increment mechanical part or required space, the test system by providing recess brake side side test pallet are arranged without reason. ;CONSTITUTION: air-tight position state, two retainers A11 and B12 are activated, and front end test pallet 20 knocks retainer 11, so that test pallet 20 stops. In the location status that B seats, brake 11 are detached from, test pallet 20 makes a movement, and front end test pallet 20 knocks retainer B12, to stop test pallet 20. In the B seats that C-position, plug A11 are activated, and plug B12 is detached from. Test pallet 20 makes a movement, and aft recess 21 knocks retainer A11, so that test pallet 20 stops. In the C-position that D-position, plug B12 are activated, and plug A11 is detached from. Test pallet 20 makes a movement, and aft recess 21 knocks retainer B12, so that test pallet 20 stops. ;COPYRIGHT:(C) 1996, JPO