AUTOMATIC HANDLER FOR IC TEST SYSTEM, TEST TRAY STOPPING MECHANISM AND TEST TRAY TRANSFERRING METHOD FOR AUTOMATIC HANDLER OF IC TEST SYSTEM

摘要

AUTOMATIC HANDLER FUR IC TEST SYSTEM, TEST TRAY STOPPING MECHANISM AND TEST TRAM' TRANSFERRING METHOD FUR AUTOMATIC HANDLER OF IC TEST SYSTEMABSTRACTA handier includes a tray for loading IC devices inwhich. the IC devices are aligned in the tray with a shorterdistance with one another than a distance between testcontactors and a pair of positioning stoppers provided in atest head area along a moving direction of the tray inwhich the positioning stoppers are spaced by the distances equal to the distance of the IC devices in the tray. Inthe handler, the distance-of the contactors is adjusted toan integer multiple of the distance of the IC devices inthe tray. One of the positioning stoppers contacts thetray to determine s first position for testing the ICdevices in a first line in the tray, and then the tray istransferred until other positioning stoppers contacts thetray in a second position for testing the IC devices in asecond line in the tray.Figure 3