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METHOD FOR ETCH RATE ENHANCEMENT BY BACKGROUND OXYGEN CONTROL IN A SOFT ETCH SYSTEM

机译:软蚀刻系统中背景氧控制提高蚀刻速率的方法

摘要

Invention is etching substrate (26) containing oxide layer to reduce activated oxygen within plasma (22) and maintain high soft etch rate in series of subsequent etches. Second substrate (28) in form of substrate ring, is utilized in processing chamber (12) and is etched in conjunction with first substrate (26) being processed. Substrate ring (28) is formed of material which, when etched, reacts with activated oxygen to form stable oxygen-containing compound which may be evacuated from system.
机译:本发明是蚀刻包含氧化物层的衬底(26),以减少等离子体(22)内的活性氧并在一系列后续蚀刻中保持高的软蚀刻速率。呈衬底环形式的第二衬底(28)用于处理室(12),并与正在处理的第一衬底(26)一起蚀刻。衬底环(28)由当蚀刻时与活化的氧反应以形成稳定的含氧化合物的材料形成,该化合物可以从系统中排出。

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