首页> 外国专利> METHOD AND APPARATUS FOR DISTRIBUTING GAS WITHIN HIGH DENSITY PLASMA PROCESS CHAMBER TO ENSURE UNIFORM PLASMA

METHOD AND APPARATUS FOR DISTRIBUTING GAS WITHIN HIGH DENSITY PLASMA PROCESS CHAMBER TO ENSURE UNIFORM PLASMA

机译:用于在高密度等离子体处理室内分配气体以确保等离子体均匀的方法和装置

摘要

An improved plasma processing chamber (20) is provided, which includes plural rotatable arms (105). Each rotatable arm (105) of the plurality of rotatable arms (105) has plural orifices for distributing at least one processing gas into the plasma processing chamber (20). In one embodiment, the gas distributor (100) is immersed in the plasma and is located in relatively close proximity to the semiconductor wafer (70) or wafers to be processed. In another embodiment, the spacing between the gas distributor (100) and the wafer (70) additionally may be adjusted. In an alternative embodiment, the gas distributor (100) is electrically insulated from the rest of the plasma processing chamber (20) and is otherwise designed to facilitate RF biasing so it may be cleaned in situ by RF means (30).
机译:提供了一种改进的等离子体处理室(20),其包括多个可旋转臂(105)。多个旋转臂(105)中的每个旋转臂(105)具有多个孔口,用于将至少一种处理气体分配到等离子体处理室(20)中。在一实施例中,气体分配器(100)浸没在等离子体中并且位于相对靠近要处理的半导体晶片(70)或多个晶片的位置。在另一个实施例中,气体分配器(100)和晶片(70)之间的间隔可以另外调节。在替代实施例中,气体分配器(100)与等离子体处理室(20)的其余部分电绝缘,并且被设计为便于RF偏压,因此可以通过RF装置(30)原位清洁。

著录项

  • 公开/公告号WO0183852A1

    专利类型

  • 公开/公告日2001-11-08

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;JOHNSON WAYNE L.;

    申请/专利号WO2001US11733

  • 发明设计人 JOHNSON WAYNE L.;

    申请日2001-04-27

  • 分类号C23F1/02;C23C14/34;

  • 国家 WO

  • 入库时间 2022-08-22 01:16:50

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号