SEMICONDUCTOR IC CIRCUIT FOR PROVIDING INTERNAL SIGNAL WHICH TO ACTIVATION VOLTAGE LEVEL WITHOUT CONNECTING SIGNAL PAD FIXED BY ACTIVATION TO DRIVER OF EXTERNAL TESTER, IN WAFER TEST

摘要

PURPOSE: A semiconductor IC circuit is provided to apply an internal signal for commanding an operation of a signal pad to activation voltage level without connecting the signal pad to a driver of external tester, the signal pad is fixed to activation when testing a wafer. CONSTITUTION: A semiconductor IC circuit(10) has many signal pads, and has a predetermined signal pad among many signal pads, where the signal pad is fixed to activation while testing a wafer. A test mode enable signal generator(120) responds to a power-up signal for indicating a state of an operation power-supply of the semiconductor IC circuit and a mode address for indicating the wafer test mode, and then generates a mode enable signal. The test mode driver responds to a test mode enable signal, ignores(don't care) a voltage level applied to the signal pad from the external part, and fixes an internal signal for informing an operation of the signal pad to activation.