首页> 外国专利> METHOD FOR CHEMICALLY AND MECHANICALLY PLANARIZING POLYMER-BASED LOW-K INTERLAYER DIELECTRIC

METHOD FOR CHEMICALLY AND MECHANICALLY PLANARIZING POLYMER-BASED LOW-K INTERLAYER DIELECTRIC

机译:基于聚合物的低k层间介电层的化学和机械平面化方法

摘要

PURPOSE: A method for chemically and mechanically planarizing a polymer-based low-k interlayer dielectric is provided to guarantee polishing uniformity regarding the entire wafer and to shorten the time necessary for planarization by less than a half, by increasing a polishing speed of the polymer-based low-k interlayer dielectric by at least 10. CONSTITUTION: A polymer-based interlayer dielectric(12) is formed on a lower layer(10) having a predetermined conductive layer. A chemical mechanical polishing(CMP) process is performed to planarize the polymer-based interlayer dielectric by using fluroro-carbon-based polishing pad and ceria-based slurry.
机译:目的:提供一种化学和机械平面化基于聚合物的低k层间电介质的方法,以通过提高聚合物的抛光速度来保证整个晶片的抛光均匀性,并使平面化所需的时间缩短不到一半。基的低k层间电介质至少10。组成:在具有预定导电层的下层(10)上形成聚合物基的层间电介质(12)。通过使用氟碳基抛光垫和二氧化铈基浆料,执行化学机械抛光(CMP)工艺以平坦化聚合物基层间电介质。

著录项

  • 公开/公告号KR20010064082A

    专利类型

  • 公开/公告日2001-07-09

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR19990062202

  • 发明设计人 OH CHAN GWON;

    申请日1999-12-24

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-22 01:13:14

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