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Forming method of Ru film using chemical vapor deposition with changing process conditions and Ru film formed thereby

机译:使用改变工艺条件的化学气相沉积形成Ru膜的方法和由此形成的Ru膜

摘要

PURPOSE: A method for manufacturing a ruthenium layer by a chemical vapor deposition(CVD) method while varying a process condition is provided to improve step coverage and surface morphology, by initially depositing a ruthenium layer of which a nuclear formation rate is faster than a growth rate, and by afterwards depositing a ruthenium layer of which the growth rate is faster than the nuclear formation rate. CONSTITUTION: While the pressure inside a deposition chamber is maintained at the first pressure and the flow rate of oxygen gas is maintained at the first flow rate, a ruthenium layer is deposited. While the pressure inside the deposition chamber is maintained at the second pressure and the flow rate of oxygen gas is maintained at the second flow rate, a ruthenium layer is deposited. The first pressure is higher than the second pressure, and the first flow rate is greater than the second flow rate.
机译:目的:提供一种通过化学气相沉积(CVD)方法制造钌层的方法,同时改变工艺条件,以通过首先沉积其核形成速率快于生长的钌层来改善阶梯覆盖率和表面形态。率,然后沉积钌层,其生长速度快于核形成速度。宪法:在沉积室内的压力保持在第一压力和氧气的流速保持在第一流速,钌层沉积。在将沉积室内的压力保持在第二压力并且将氧气的流速保持在第二流速的同时,沉积钌层。第一压力高于第二压力,并且第一流速大于第二流速。

著录项

  • 公开/公告号KR20010066747A

    专利类型

  • 公开/公告日2001-07-11

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20000012056

  • 发明设计人 WON SEOK JUN;YOO CHA YEONG;

    申请日2000-03-10

  • 分类号H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-22 01:13:15

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