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Optical impulse mode near field scanning microscope with feedback control achieved using a piezo-electric oscillator to change the amplitude and phase of an optical fiber test head to yield improved control and sensitivity
Optical impulse mode near field scanning microscope with feedback control achieved using a piezo-electric oscillator to change the amplitude and phase of an optical fiber test head to yield improved control and sensitivity
Microscope comprises a laser light source (10), a fiber optic test head (20) with fiber optic cable between near light source (10) and at the far end the near field point light source, a piezo-electric ceramic oscillator (30) suspended from a hanging arm (34) and a feedback signal element (40) that generates a harmonic wave signal to drive the ceramic crystal. The wave produced by the piezo-electric ceramic crystal is used to change the amplitude and phase of the optical fiber test head (20) so that feedback control can be carried out.
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