首页> 外国专利> Semiconductor image sensor used as a CMOS sensor comprises a semiconductor substrate, a photodiode, transistor, insulating layer and an optical layer

Semiconductor image sensor used as a CMOS sensor comprises a semiconductor substrate, a photodiode, transistor, insulating layer and an optical layer

机译:用作CMOS传感器的半导体图像传感器包括半导体衬底,光电二极管,晶体管,绝缘层和光学层

摘要

Semiconductor image sensor comprises a semiconductor substrate (210) which is divided into a light determining region and a periphery switching region; a photodiode (220) provided above the light determining region (212); at least one transistor (230) provided above the periphery switching region (214); at least one insulating layer (240) provided above the diode and the transistor; and an optical layer (270) on the insulating layer to efficiently transfer light to the photodiode. Preferred Features: The optical layer is made of tetraethoxyorthosilicate and is formed by PECVD process.
机译:半导体图像传感器包括:半导体基板(210),其被划分为光确定区域和外围切换区域;以及半导体基板(210)。设置在光确定区域(212)上方的光电二极管(220);至少一个晶体管(230)设置在外围开关区域(214)上方;至少一个绝缘层(240)设置在二极管和晶体管上方;光学层(270)位于绝缘层上,以有效地将光传输至光电二极管。优选特征:光学层由原硅酸四乙氧基酯制成,并通过PECVD工艺形成。

著录项

  • 公开/公告号DE10031439A1

    专利类型

  • 公开/公告日2001-03-01

    原文格式PDF

  • 申请/专利权人 HYUNDAI ELECTRONICS INDUSTRIES CO. LTD.;

    申请/专利号DE2000131439

  • 发明设计人 PARK KI-NAM;

    申请日2000-06-28

  • 分类号H01L27/146;

  • 国家 DE

  • 入库时间 2022-08-22 01:09:46

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