首页> 外国专利> Solid-state image sensor with vertical charge coupled device(s) - has photodiode array on semiconductor substrate, transfer gates formed on insulating layers and zigzag metal wiring

Solid-state image sensor with vertical charge coupled device(s) - has photodiode array on semiconductor substrate, transfer gates formed on insulating layers and zigzag metal wiring

机译:具有垂直电荷耦合器件的固态图像传感器-在半导体基板上具有光电二极管阵列,在绝缘层上形成的传输门和之字形金属布线

摘要

The sensor includes photodiodes (41) which have impurities of one conductivity, while the transfer gates (55) have impurities of second conductivity. One gate side is in contact with the photodiodes. VCCDs have first conductivity impurities and are in contact with the transfer gate other side. Channel-shaped separating layers (57) with second conductivity impurities are in contact with the photodiode other sides. On the substrate surface an insulating layer (58) is formed over the VCCDs, while a second such layer (60) covers second gates (45). A light screening layer (47) covers the sections not belonging to the photodiodes. USE/ADVANTAGE -For video camera, medical applications etc. Prevention of smear phenomenon by effective light screening.
机译:该传感器包括光电二极管(41),其具有一种导电性的杂质,而传输门(55)具有第二导电性的杂质。栅极一侧与光电二极管接触。 VCCD具有第一导电杂质,并且与传输门的另一侧接触。具有第二导电性杂质的沟道状的隔离层(57)与光电二极管的另一面接触。在基板表面上,绝缘层(58)形成在VCCD上方,而第二这样的层(60)覆盖第二栅极(45)。遮光层(47)覆盖不属于光电二极管的部分。使用/优点-用于摄像机,医疗应用等。通过有效的光屏蔽防止出现拖影现象。

著录项

  • 公开/公告号DE4316906A1

    专利类型

  • 公开/公告日1993-12-02

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD. SUWON KR;

    申请/专利号DE19934316906

  • 发明设计人 KIM BUM SIK SUWON KR;

    申请日1993-05-19

  • 分类号H01L27/148;H01L23/522;

  • 国家 DE

  • 入库时间 2022-08-22 04:35:43

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