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Method of forming a photomask of high dimensional accuracy utilizing heat treatment equipment

机译:利用热处理设备形成高尺寸精度的光掩模的方法

摘要

Heat is supplied from a base plate located under a photomask blank to the photomask blank in a pre-baking process, and heat is partially supplied from an end surface use plate to the photomask blank so that the intra-planar temperature distribution of the photomask blank becomes uniform through correction of heat radiation from the end surface of the photomask blank. The photomask blank is cooled in a cooling process after the pre-baking process while partially supplying heat from the end surface use plate to the photomask blank so that the intra-planar temperature distribution of the photomask blank becomes uniform through the correction of heat radiation from the end surface of the photomask blank.
机译:在预烘焙过程中,从位于光掩模坯料下方的基板向光掩模坯料供热,并且从端面使用板向光掩模坯料部分供热,以使光掩模坯料的面内温度分布通过校正来自光掩模坯料的端面的热辐射而变得均匀。光掩模坯料在预烘烤过程之后的冷却过程中被冷却,同时从端面用板向光掩模坯料部分地提供热量,从而通过校正来自热辐射的热量,光掩模坯料的平面内温度分布变得均匀。光掩模毛坯的端面。

著录项

  • 公开/公告号US6228540B1

    专利类型

  • 公开/公告日2001-05-08

    原文格式PDF

  • 申请/专利权人 SHARPE KABUSHIKI KAISHA;

    申请/专利号US19990256305

  • 发明设计人 SHINJI KOBAYASHI;

    申请日1999-02-24

  • 分类号G03F90/00;

  • 国家 US

  • 入库时间 2022-08-22 01:04:25

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