首页> 外国专利> PHOTOMASK FORMING METHOD AND HEAT TREATMENT EQUIPMENT CAPABLE OF FORMING A PHOTOMASK OF HIGH DIMENSIONAL ACCURACY

PHOTOMASK FORMING METHOD AND HEAT TREATMENT EQUIPMENT CAPABLE OF FORMING A PHOTOMASK OF HIGH DIMENSIONAL ACCURACY

机译:能够形成高精度的光掩模的光掩模形成方法和热处理设备

摘要

Free and supplying heat to the photomask blank 4 from the lower portion of the base plate (1) disposed on the photomask blank 4 in the baking process, to correct the end face side heat of the photomask blank (4) The photomask blank and (4) in part by supplying heat to the photomask blank 4 from the end face plate (3) for the in-plane temperature distribution to be made uniform. In the cooling step after the prebaking process, the photomask blank (4) to correct the end face side radiation 15, the photomask blank (4) The photomask blank from the end surface plate (3) for the in-plane temperature distribution to be made uniform in the and partially supplied to the column 11 at a 4 to cool the photomask blank (4).
机译:在烘烤过程中,从设置在光掩模坯料4上的基板(1)的下部释放热量并向光掩模坯料4供热,以校正光掩模坯料(4)的端面侧热量。 4)部分地通过从端面板(3)向光掩模坯料4提供热量以使面内温度分布均匀。在预烘烤过程之后的冷却步骤中,用于校正端面侧辐射15的光掩模坯料(4),光掩模坯料(4)来自端面板(3)的光掩模坯料的面内温度分布为使光掩模坯(4)均匀地冷却并在4处部分地供应给柱11以冷却光掩模坯料(4)。

著录项

  • 公开/公告号KR100324440B1

    专利类型

  • 公开/公告日2002-02-27

    原文格式PDF

  • 申请/专利权人 NULL NULL;

    申请/专利号KR19990006323

  • 发明设计人 고바야시신지;

    申请日1999-02-25

  • 分类号G03F1/08;G03F1/00;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:56

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