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The new shallow groove isolation etching method of not using HBR

机译:不使用HBR的新型浅槽隔离刻蚀方法

摘要

(57) Abstract Topic The hydrogen bromide the etching constitution which is not included is offered. Is longer in comparison with etsuchiyanto which therefore includes the hydrogen bromide life of the chamber where etsuchiyanto of this invention corrosiveness is little, little cost is given. SolutionsThe true tsu immediately etching constitution in order to etch the groove where the wall and the taper are attached, includes with chlorine and nitrogen and helium and the blend of oxygen to the silicon substrate. It can fill up the groove which can as the result, easily with the dielectric material without forming the air gap.
机译:(57)<摘要> <主题>提供了不包含的溴化氢的蚀刻结构。与因此包括本发明的乙苯胺腐蚀性小的腔室的溴化氢寿命在内的乙苯胺相比更长,因此成本较低。解决方案真正的tsu刻蚀结构是为了刻蚀壁和锥度相连的凹槽,其中包括氯,氮和氦以及氧与硅基板的混合。因此,可以在不形成气隙的情况下用电介质材料容易地填充沟槽。

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