首页> 外国专利> SPECTRAL REFLECTANCE MEASURING SHEET, METHOD OF MEASURING SPECTRAL REFLECTANCE, AND PROGRAM FOR CONTROLLING SPECTRAL REFLECTANCE MEASUREMENT

SPECTRAL REFLECTANCE MEASURING SHEET, METHOD OF MEASURING SPECTRAL REFLECTANCE, AND PROGRAM FOR CONTROLLING SPECTRAL REFLECTANCE MEASUREMENT

机译:光谱反射率测量表,光谱反射率的测量方法以及控制光谱反射率的程序

摘要

PROBLEM TO BE SOLVED: To prevent a spectral reflectance measuring sheet from being measured in a wrong order or being set at a wrong position to be measured.;SOLUTION: In the spectral reflectance measuring sheet 101, two position determining marks 104-1 to 104-2 and order determining marks 105-1-105-6 indicating the order of the sheet to be measured are printed, in addition to a large number of color patches 102 outputted by a printer whose color reproductivity is to be measured, at prescribed positions. The spectral reflectances at the positions with the marks 104-1 and 104-2 are measured when the sheet is set in a measuring device, and when the two marks are normally detected, it is determined that the sheet is set at a proper position. The marks 105-1-105-6 are provided in number equal to the order of processes of the sheet, and an operator is informed of the order of processes of the sheet by the marks. Further, the spectral reflectance of the positions of the marks 105-1-105-6 are measured to be used for confirming whether the sheet is set in the proper order or not.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:为了防止光谱反射率测量片以错误的顺序测量或将其放置在错误的测量位置。解决方案:在光谱反射率测量片101中,两个位置确定标记104-1至104在规定的位置,除了要测量彩色再现性的打印机输出的大量色块102之外,还打印有-2和指示要测量的纸张的顺序的顺序确定标记105-1-105-6。 。当将薄片放置在测量装置中时,在具有标记104-1和104-2的位置处测量光谱反射率,并且当正常检测到两个标记时,确定将薄片放置在适当位置。标记105-1-105-6的数量等于薄片的处理顺序,并且通过标记将薄片的处理顺序通知给操作者。另外,测量标记105-1-105-6的位置的光谱反射率,以用于确认片材是否以正确的顺序放置。COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002303549A

    专利类型

  • 公开/公告日2002-10-18

    原文格式PDF

  • 申请/专利权人 NEC SOFT LTD;

    申请/专利号JP20010104346

  • 发明设计人 OGINO KOJI;

    申请日2001-04-03

  • 分类号G01J3/52;B41J29/46;

  • 国家 JP

  • 入库时间 2022-08-22 00:58:57

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