SAMPLING DIGITIZER AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING DEVICE EQUIPPED WITH THE SAMPLING DIGITIZER

摘要

PROBLEM TO BE SOLVED: To provide a sampling digitizer capable of making the timing of a clock signal coincide with a jitter measuring point in a short time.;SOLUTION: In this sampling digitizer equipped with a sampling head 11, a clock generation part 12, a waveform digitizer 13, and a timing control circuit 15, a comparator 21 is installed on the output side of the sampling head, and sampling data are supplied to one input terminal of the comparator. A prescribed threshold value is given to the other input terminal of the comparator, and it is detected whether the sampling data are larger or smaller than the threshold value. An output signal of the comparator is supplied to a binary search processing circuit 22, and the output thereof is supplied to a timing control circuit 15, to thereby control the timing of the clock signal applied to the sampling head from the clock generation part.;COPYRIGHT: (C)2002,JPO