首页> 外国专利> DISTRIBUTED DENSITY MASK AND METHOD FOR PRODUCING THE SAME BY MULTISTAGE EXPOSURE METHOD

DISTRIBUTED DENSITY MASK AND METHOD FOR PRODUCING THE SAME BY MULTISTAGE EXPOSURE METHOD

机译:分布密度掩模和采用多阶段曝光方法生产相同密度的方法

摘要

PROBLEM TO BE SOLVED: To inexpensively and easily produce a distributed density mask at a high production speed without requiring a special equipment.;SOLUTION: A mask blank is divided into unit cells and light transmissive regions or light shielding regions of the respective unit cells are determined. The determined light transmissive regions or light shielding regions are disposed on each gird and necessary pattern forming frequency, focal depth and beam diameter are calculated by CAD(computer aided design) and converted into data. A sensitive material on the mask blank is multistage-patterned by prescribed frequency on the basis of the data under prescribed conditions (focal depth and beam diameter) and the mask blank is developed and rinsed to obtain a three-dimensional sensitive material pattern. The shape of the sensitive material pattern is transferred to a light shielding film by etching.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:为了以低成本且容易地以高生产速度生产分布式密度掩模而无需特殊设备。;解决方案:将掩模坯分为单元电池,并且将各个单元电池的透光区域或遮光区域划分为单个单元。决心。所确定的透光区域或遮光区域被布置在每个网格上,并且必要的图案形成频率,焦深和光束直径通过CAD(计算机辅助设计)计算并转换为数据。根据规定条件(焦深和光束直径)下的数据,以规定的频率对掩模坯料上的敏感材料进行多阶段构图,然后对掩模坯料进行显影和冲洗以获得三维敏感材料图案。通过蚀刻将敏感材料图案的形状转印到遮光膜上。版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002139824A

    专利类型

  • 公开/公告日2002-05-17

    原文格式PDF

  • 申请/专利权人 RICOH OPT IND CO LTD;

    申请/专利号JP20000334306

  • 发明设计人 UMEKI KAZUHIRO;

    申请日2000-11-01

  • 分类号G03F1/08;G02F1/1335;G03F7/20;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-22 00:58:50

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号