首页> 外国专利> RUTHENIUM COMPOUND FOR CHEMICAL VAPOR DEPOSITION AND METHOD FOR CHEMICAL VAPOR DEPOSITION OF RUTHENIUM THIN FILM OR RUTHENIUM COMPOUND THIN FILM

RUTHENIUM COMPOUND FOR CHEMICAL VAPOR DEPOSITION AND METHOD FOR CHEMICAL VAPOR DEPOSITION OF RUTHENIUM THIN FILM OR RUTHENIUM COMPOUND THIN FILM

机译:用于化学气相沉积的钌化合物以及用于钌薄膜或钌复合薄膜的化学气相沉积的方法

摘要

PROBLEM TO BE SOLVED: To obtain a ruthenium compound for a chemical vapor deposition, capable of producing a ruthenium thin film or a ruthenium compound thin film having excellent morphology even in the cases of high-temperature deposition and excellent step coverage and producing a thin film having relative low resistivity.;SOLUTION: This ruthenium compound is useful for producing a ruthenium thin film or a ruthenium compound thin film by a chemical vapor deposition method and is a ruthenium compound for a chemical vapor deposition comprised of an acylcyclopentadienyl(cyclopentadienyl)ruthenium substituted with a straight-chain or branched-chain hydrocarbon group. The ruthenium compound has excellent morphology even in the case of a decomposition at a relatively high temperature of 250-450°C and can produce a ruthenium thin film having low resistivity.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:为了获得用于化学气相沉积的钌化合物,即使在高温沉积和优异的台阶覆盖率的情况下,也能够生产形态优异的钌薄膜或钌化合物薄膜。解决方案:该钌化合物可用于通过化学气相沉积法制备钌薄膜或钌化合物薄膜,并且是由酰基环戊二烯基(环戊二烯基)钌取代的化学气相沉积钌化合物具有直链或支链的烃基。钌化合物即使在250-450℃的相对较高的温度下分解也具有优异的形貌,并且可以制得低电阻率的钌薄膜。; COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002114796A

    专利类型

  • 公开/公告日2002-04-16

    原文格式PDF

  • 申请/专利权人 TANAKA KIKINZOKU KOGYO KK;

    申请/专利号JP20000310504

  • 发明设计人 OKAMOTO KOJI;

    申请日2000-10-11

  • 分类号C07F17/02;C07F15/00;C23C16/18;

  • 国家 JP

  • 入库时间 2022-08-22 00:57:59

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