首页> 外国专利> OPTICAL PICKUP DEVICE CAPABLE OF DETECTING CHANGE IN THICKNESS OF RECORDING MEDIUM AND/OR CORRECTING SPHERICAL ABERRATION CAUSED BY CHANGE IN THICKNESS

OPTICAL PICKUP DEVICE CAPABLE OF DETECTING CHANGE IN THICKNESS OF RECORDING MEDIUM AND/OR CORRECTING SPHERICAL ABERRATION CAUSED BY CHANGE IN THICKNESS

机译:能够检测记录介质的厚度变化和/或校正由厚度变化引起的球面像差的光学拾取装置

摘要

PROBLEM TO BE SOLVED: To provide an optical pickup capable of detecting change in thickness of a recording medium and/or correcting spherical aberration caused by a change in thickness. SOLUTION: The optical pickup is equipped with, as a light-splitting/detecting means, a photodetector or a light-splitting element installed for the purpose of splitting/ detecting a light beam, which is reflected from a recording medium and which is passed through an objective lens and an optical-path changing means, by taking account of change in light-quality distribution on the thickness change in the recording medium, and also equipped with a plurality of photodetectors for receiving each beam split by the light splitting element; the optical pickup is designed to detect the signals of change in thickness by calculating the detection signals outputted from the photodetectors. The optical pickup device is also capable of detecting the change in thickness of the recording medium even for an optical system structure having no astigmatic lens that causes astigmatism on the light-receiving side, is provided with an actuator that drives a spherical aberration correcting element or a collimator lens along the optical axis, and is able to correct the spherical aberration caused by the change in thickness of the recording medium.
机译:解决的问题:提供一种能够检测记录介质的厚度变化和/或校正由厚度变化引起的球面像差的光学拾取器。 SOLUTION:光学拾取器配备有作为分光/检测装置的光电检测器或分光元件,该光检测器或分光元件的安装是为了分离/检测从记录介质反射并通过的光束物镜和光程改变装置,通过考虑记录介质厚度变化的光质量分布的变化,还配备有多个光电探测器,用于接收由分光元件分开的每个光束;光学头设计为通过计算从光电探测器输出的检测信号来检测厚度变化的信号。即使对于不具有在受光侧引起像散的像散透镜的光学系统结构,光学拾取装置也能够检测记录介质的厚度变化,该光学系统设置有驱动球面像差校正元件的致动器或沿着光轴的准直透镜,并且能够校正由记录介质的厚度变化引起的球面像差。

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