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ION MIGRATION ASSESSMENT TEST METHOD FOR PRINTED CIRCUIT BOARD INSULATING MATERIAL

机译:印刷电路板绝缘材料的离子迁移评估测试方法

摘要

PROBLEM TO BE SOLVED: To provide an ion migration assessing method effectively and surely detecting the possibility of generation of ion migration, in a printed circuit board insulating material.;SOLUTION: This ion migration assessment test method for the printed circuit board insulating material is so constituted, that a thin film is formed of the printed circuit board insulating material, electrolyte having an electrode dipped therein is brought in contact with one surface of the thin film, pure water having the other electrode dipped therein is brought in contact with the other surface, the negative side terminal of a DC voltage is connected to the electrode dipped in the pure water, and the ion concentration of the pure water is detected, while making the DC current flow across both the electrodes.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:要提供一种有效且可靠地检测印刷电路板绝缘材料中产生离子迁移的可能性的离子迁移评估方法;解决方案:这种用于印刷电路板绝缘材料的离子迁移评估测试方法应如此构成为由印刷电路板绝缘材料形成薄膜,使浸有电极的电解质与薄膜的一个表面接触,使浸有另一电极的纯水与另一表面接触。 ,将直流电压的负端连接到浸入纯水中的电极,并检测纯水的离子浓度,同时使直流电流流过两个电极。版权所有:(C)2002,日本特许厅

著录项

  • 公开/公告号JP2002156359A

    专利类型

  • 公开/公告日2002-05-31

    原文格式PDF

  • 申请/专利权人 HITACHI CHEM CO LTD;

    申请/专利号JP20000349741

  • 发明设计人 YOKOSUKA HIROJI;YAMANAKA MITSURU;

    申请日2000-11-16

  • 分类号G01N27/49;H05K3/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:55:25

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