首页> 外国专利> DEVICE AND METHOD FOR MEASURING CHARACTERISTICS OF MAGNETORESISTANCE ELEMENT, AND DEVICE AND METHOD FOR MEASURING CHARACTERISTICS OF MAGNETIC REPRODUCING HEAD

DEVICE AND METHOD FOR MEASURING CHARACTERISTICS OF MAGNETORESISTANCE ELEMENT, AND DEVICE AND METHOD FOR MEASURING CHARACTERISTICS OF MAGNETIC REPRODUCING HEAD

机译:测量磁阻元件特性的装置和方法,以及测量磁再现头特性的装置和方法

摘要

PROBLEM TO BE SOLVED: To measure the local magnetic characteristics for evaluating more detailed characteristics about a magnetic reproducing head, for which the judgement of the normal/defective condition based on the conventional measuring method for the operational characteristics becomes difficult accompanying the miniaturization of the head.;SOLUTION: The periodically varied magnetic field is impressed by a probe 103 of magnetic material vibrating at a specified period and the DC magnetic field slowly changed with respect to the periodically varied magnetic field is impressed by a magnetic field generator 114 respectively on an MR head 102 whereon the specified current is impressed by a constant current source 113, and a resistance value of the MR head 102 changed in accordance with the impressed magnetic field intensity is detected by an AC amplifier 115 and a synchronization detector 116, then the magnetic field intensity differentiation of the resistance value - magnetic field property is measured by a signal processor 111.;COPYRIGHT: (C)2002,JPO
机译:要解决的问题:为了评估磁再现头的更详细的特性,要测量其局部磁特性,而随着磁头的小型化,基于常规工作特性的测量方法来判断正常/缺陷状态变得困难。解决方案:周期性变化的磁场由以指定周期振动的磁性材料的探针103施加,并且相对于周期性变化的磁场缓慢变化的DC磁场分别由磁场发生器114施加在MR上通过恒定电流源113施加指定电流的磁头102,并且通过AC放大器115和同步检测器116检测根据所施加的磁场强度而改变的MR磁头102的电阻值,然后磁场电阻值的强度微分-磁场特性由信号处理器111测量。版权所有:(C)2002,JPO

著录项

  • 公开/公告号JP2002063706A

    专利类型

  • 公开/公告日2002-02-28

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP20000249324

  • 发明设计人 ABE MASAYUKI;

    申请日2000-08-21

  • 分类号G11B5/455;G01R33/09;G11B5/39;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:46

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