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QUALITY JUDGING BOARD FOR BURN-IN TEST SYSTEM AND QUALITY JUDGMENT RESULT MEMORY METHOD
QUALITY JUDGING BOARD FOR BURN-IN TEST SYSTEM AND QUALITY JUDGMENT RESULT MEMORY METHOD
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机译:内置测试系统的质量判断板和质量判断结果存储方法
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摘要
PROBLEM TO BE SOLVED: To provide a quality judging board for a burn-in test system and a quality judgment result memory method capable of writing the real-time quality judgment results of a plurality of judging boards in memories for the judging boards with triggers optionally specified for individual judging boards.;SOLUTION: A coincidence comparing circuit 5 provided on each judging board 10 compares the address and data for a device 20 under test with predetermined values and generates and outputs a trigger allowing the writing on a memory 4 to a read/write control circuit 6 if they coincide. The read/write control circuit 6 receiving the trigger from the coincidence comparing circuit 5 writes the quality judgment result judged by a judging circuit 2 at the address in the memory specified by an address pointer 7 together with the address and data for the device 20 under test.;COPYRIGHT: (C)2001,JPO
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