首页> 外国专利> QUALITY JUDGING BOARD FOR BURN-IN TEST SYSTEM AND QUALITY JUDGMENT RESULT MEMORY METHOD

QUALITY JUDGING BOARD FOR BURN-IN TEST SYSTEM AND QUALITY JUDGMENT RESULT MEMORY METHOD

机译:内置测试系统的质量判断板和质量判断结果存储方法

摘要

PROBLEM TO BE SOLVED: To provide a quality judging board for a burn-in test system and a quality judgment result memory method capable of writing the real-time quality judgment results of a plurality of judging boards in memories for the judging boards with triggers optionally specified for individual judging boards.;SOLUTION: A coincidence comparing circuit 5 provided on each judging board 10 compares the address and data for a device 20 under test with predetermined values and generates and outputs a trigger allowing the writing on a memory 4 to a read/write control circuit 6 if they coincide. The read/write control circuit 6 receiving the trigger from the coincidence comparing circuit 5 writes the quality judgment result judged by a judging circuit 2 at the address in the memory specified by an address pointer 7 together with the address and data for the device 20 under test.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:提供一种用于老化测试系统的质量判断板和一种质量判断结果存储方法,该方法能够将多个判断板的实时质量判断结果实时写入带有触发器的判断板的存储器中解决方案:每个审判板10上提供的同时比较电路5将被测设备20的地址和数据与预定值进行比较,并生成并输出触发信号,以允许在存储器4上进行写入以读取/写控制电路6,如果它们重合。接收来自同时比较电路5的触发的读/写控制电路6将由判断电路2判断的质量判断结果与地址指针7所指定的存储器中的地址和数据一起写入到地址指针7所指定的存储器中。测试。;版权:(C)2001,日本特许厅

著录项

  • 公开/公告号JP2001324547A

    专利类型

  • 公开/公告日2001-11-22

    原文格式PDF

  • 申请/专利权人 ANDO ELECTRIC CO LTD;

    申请/专利号JP20000145319

  • 发明设计人 UZUTA YOSHIYUKI;

    申请日2000-05-17

  • 分类号G01R31/28;G01R31/30;G11C29/00;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-22 00:54:29

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