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ABBE'S NUMBER MEASURING DEVICE AND ABBE'S NUMBER MEASURING METHOD

机译:阿贝数测定装置及阿贝数测定方法

摘要

PROBLEM TO BE SOLVED: To provide an Abbe's number measuring device capable of measuring while drop in measuring accuracy caused by the number of refractivity is avoided to the utmost.;SOLUTION: This Abbe's number measuring device has a lens support member 21 for supporting an inspecting lens TL installed in a measuring light path SO of the inspecting lens TL so that measuring light beams having different wave length generated in a measuring light source part 10 to measure Abbe's number of the inspecting lens TL are incident almost vertically on an incident surface TLa of the inspecting lens TL; and a detecting sensor 13 for detecting measuring light beams passing through the inspecting lens TL installed in the position opposite to the measuring light source part 10 on the boundary of the lens support member 21; and a computing circuit for computing the Abb's number based on a detected output of the detecting sensor 13.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种阿贝数测量装置,其能够进行测量,同时最大程度地避免由折射率的数量引起的测量精度的下降。解决方案:该阿贝数测量装置具有用于支撑检查的透镜支撑构件21。透镜TL安装在检查透镜TL的测量光路SO中,使得在测量光源部10中产生的用于测量检查透镜TL的阿贝数的具有不同波长的测量光束几乎垂直地入射在检测透镜TL的入射表面TLa上。检查镜TL;检测传感器13,其检测通过在透镜支撑部件21的边界上与测量光源部10相对的位置设置的检查透镜TL的测量光束。以及基于检测传感器13的检测输出来计算Abb数的计算电路; COPYRIGHT:(C)2002,JPO

著录项

  • 公开/公告号JP2002005786A

    专利类型

  • 公开/公告日2002-01-09

    原文格式PDF

  • 申请/专利权人 TOPCON CORP;

    申请/专利号JP20000190415

  • 发明设计人 YANAGI HIDEKAZU;

    申请日2000-06-26

  • 分类号G01M11/02;

  • 国家 JP

  • 入库时间 2022-08-22 00:53:23

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