首页> 外国专利> Semiconductor laser device which includes AlGaAs optical waveguide layer being formed over internal stripe groove and having controlled refractive index

Semiconductor laser device which includes AlGaAs optical waveguide layer being formed over internal stripe groove and having controlled refractive index

机译:包括AlGaAs光波导层的半导体激光器装置,该AlGaAs光波导层形成在内部条纹凹槽上方并具有受控的折射率

摘要

In a semiconductor laser device having an InGaAsP compressive strain quantum well active layer, an InGaAsP first upper optical waveguide layer formed on the active layer, and a current confinement layer which is formed above the first upper optical waveguide layer and includes a stripe groove. An AlGaAs second upper optical waveguide layer having an approximately identical refractive index to that of the first upper optical waveguide layer covers the current confinement layer and the stripe groove. The product of the strain and the thickness of the active layer does not exceed 0.25 nm. All the layers other than the compressive strain quantum well active layer lattice-match with GaAs. An AlGaAs or InGaAsP upper cladding layer formed above the second upper optical waveguide layer has an approximately identical refractive index to that of a lower cladding layer formed under the active layer.
机译:在具有InGaAsP压缩应变量子阱有源层的半导体激光装置中,在有源层上形成有InGaAsP第一上部光波导层,并且在第一上部光波导层上方形成有带状槽的电流限制层。具有与第一上光波导层的折射率近似相同的折射率的AlGaAs第二上光波导层覆盖电流限制层和条形凹槽。应变与活性层的厚度的乘积不超过0.25nm。除压缩应变量子阱有源层以外的所有层与GaAs晶格匹配。形成在第二上部光波导层上方的AlGaAs或InGaAsP上部包层具有与形成在有源层下方的下部包层的折射率大致相同的折射率。

著录项

  • 公开/公告号US2002044584A1

    专利类型

  • 公开/公告日2002-04-18

    原文格式PDF

  • 申请/专利权人 FUJI PHOTO FILM CO. LTD.;

    申请/专利号US20010981258

  • 发明设计人 TOSHIAKI FUKUNAGA;

    申请日2001-10-18

  • 分类号H01S5/00;

  • 国家 US

  • 入库时间 2022-08-22 00:52:41

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号