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Semiconductor laser device which includes AlGaAs optical waveguide layer being formed over internal stripe groove and having controlled refractive index
Semiconductor laser device which includes AlGaAs optical waveguide layer being formed over internal stripe groove and having controlled refractive index
In a semiconductor laser device having an InGaAsP compressive strain quantum well active layer, an InGaAsP first upper optical waveguide layer formed on the active layer, and a current confinement layer which is formed above the first upper optical waveguide layer and includes a stripe groove. An AlGaAs second upper optical waveguide layer having an approximately identical refractive index to that of the first upper optical waveguide layer covers the current confinement layer and the stripe groove. The product of the strain and the thickness of the active layer does not exceed 0.25 nm. All the layers other than the compressive strain quantum well active layer lattice-match with GaAs. An AlGaAs or InGaAsP upper cladding layer formed above the second upper optical waveguide layer has an approximately identical refractive index to that of a lower cladding layer formed under the active layer.
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