首页> 外国专利> Thin-film deposition of low conductivity targets using cathodic ARC plasma process

Thin-film deposition of low conductivity targets using cathodic ARC plasma process

机译:使用阴极ARC等离子工艺的低电导率靶薄膜沉积

摘要

This invention discloses a cathodic arc deposition apparatus for depositing a layer of low-conductivity material on a surface of a substrate. The cathodic arc deposition apparatus includes a source contained in a vacuum chamber. The source further includes a target mount for mounting a target thereon wherein the target comprising fused mixture of powders of the low-conductivity material hot-pressed with powders of a high conductivity material functioning as conductivity-enhancement matrix. The cathodic arc deposition apparatus further includes an electric arc for striking the target to evaporate a plurality of ions of the low conductivity material and the high conductivity material. The cathodic arc deposition apparatus further includes an ion trajectory guiding means for guiding the ions for projecting to the substrate contained in the vacuum chamber. The cathodic arc deposition apparatus further includes an ion shielding means for selective shielding ions of the conductive material for depositing only the ions of the low-conductivity material on the substrate.
机译:本发明公开了一种阴极电弧淀积设备,用于在衬底表面上淀积一层低电导率材料。阴极电弧沉积设备包括容纳在真空室中的源。该源还包括用于在其上安装靶的靶支架,其中该靶包括热压的低电导率材料的粉末与用作电导率增强基质的高电导率材料的粉末的熔融混合物。阴极电弧沉积设备还包括用于撞击靶以蒸发低电导率材料和高电导率材料的多个离子的电弧。阴极电弧沉积设备还包括离子轨迹引导装置,用于引导离子以投射到容纳在真空室中的基板上。阴极电弧沉积设备还包括离子屏蔽装置,该离子屏蔽装置用于选择性地屏蔽导电材料的离子,以仅将低电导率材料的离子沉积在基板上。

著录项

  • 公开/公告号US2002139662A1

    专利类型

  • 公开/公告日2002-10-03

    原文格式PDF

  • 申请/专利权人 LEE BRENT W.;

    申请/专利号US20010791438

  • 发明设计人 BRENT W. LEE;

    申请日2001-02-21

  • 分类号C23C14/00;

  • 国家 US

  • 入库时间 2022-08-22 00:51:36

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