Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope

摘要

A probe for a near-field optical microscope was conceived in which a tube is thermally bent in the form of a hook; a microscopic aperture of the tube which has been thermally extended and cut away is provided at an end thereof; a part of the tube opposite to the microscopic aperture is removed to form an aperture at the removed portion to thereby provide a structure having no obstacle in the space between said aperture at the end and a near-field optical microscope utilizing the same was configured.