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Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope
Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope
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机译:用于近场光学显微镜的探针,其制造方法和扫描近场光学显微镜
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摘要
A probe for near-field optical microscope in which a tube is thermally bent in the form of a hook (13); a microscopic aperture (12) of the tube which has been thermally extended and cut away is provided at an end thereof; a part of the tube opposite to the microscopic aperture is removed to form an aperture (14) at the removed portion to thereby provide a structure having no obstacle in the space between said aperture and said microscopic aperture. The invention also provides a near-field optical microscope utilising the probe. IMAGE IMAGE IMAGE
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