首页> 外国专利> Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope

Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope

机译:用于近场光学显微镜的探针,其制造方法和扫描近场光学显微镜

摘要

A probe for near-field optical microscope in which a tube is thermally bent in the form of a hook (13); a microscopic aperture (12) of the tube which has been thermally extended and cut away is provided at an end thereof; a part of the tube opposite to the microscopic aperture is removed to form an aperture (14) at the removed portion to thereby provide a structure having no obstacle in the space between said aperture and said microscopic aperture. The invention also provides a near-field optical microscope utilising the probe. IMAGE IMAGE IMAGE
机译:一种用于近场光学显微镜的探针,其中的管子以钩子的形式热弯曲(13);在管的一端设置有已热延伸并切去的微观孔(12)。去除与微观孔相对的管的一部分以在移除部分处形成孔(14),从而提供在所述孔与所述微观孔之间的空间中没有障碍物的结构。本发明还提供一种利用该探针的近场光学显微镜。 <图像> <图像> <图像>

著录项

  • 公开/公告号EP0938012B1

    专利类型

  • 公开/公告日2003-11-05

    原文格式PDF

  • 申请/专利权人 SEIKO INSTRUMENTS INC.;

    申请/专利号EP19990301323

  • 发明设计人 MURAMATSU HIROSHI;

    申请日1999-02-23

  • 分类号G02B21/00;

  • 国家 EP

  • 入库时间 2022-08-21 23:53:25

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