首页> 外国专利> Method for post-oxidation heating of a structure comprising SiO2

Method for post-oxidation heating of a structure comprising SiO2

机译:对包含SiO 2的结构进行后氧化加热的方法

摘要

The present invention is related to a method for post-oxidation heating of at least one substrate comprising at least a SiO2 layer or a SiO2/poly-Si layer structure, comprising the steps of: creating an inert gaseous ambient in a furnace, said ambient having a partial pressure within a predetermined range and said gaseous ambient comprising helium molecules, which have a suitable diameter for penetrating into the SiO2 and/or the poly-Si material; placing the substrate into said ambient; thereafter heating said furnace to a temperature of at least 200° C. for a predetermined period of time; cooling said furnace while maintaining said gaseous ambient in said predetermined pressure range in said furnace.
机译:本发明涉及一种用于至少一个包括至少SiO 2 层或SiO 2 /多晶硅层结构的衬底的后氧化加热的方法,包括以下步骤:在炉中产生惰性气体环境,所述环境具有在预定范围内的分压,并且所述气体环境包含氦分子,所述氦分子具有适合于渗透到SiO 2 中的直径和/或多晶硅材料;将基板置于所述环境中;之后将所述炉加热到至少200℃的温度。 C.在预定的时间段内;冷却所述炉子,同时将所述气态环境保持在所述炉子的所述预定压力范围内。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号