Methodology for testing and qualifying an integrated circuit by measuring an operating frequency as a function of adjusted timing edges

摘要

A testing methodology for increasing the performance and reliability of integrated circuits (“chips”) outputted from a manufacturing process, utilizes a method by which the operating frequency of the integrated circuit is measured when the Self-Timed Pulse Control parameter is adjusted to provide a more strict test upon the chip. Under this more stringent test, the integrated circuits that do not pass the test then are designated as failures or marketed with listed lower operating frequencies.