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Method and apparatus for a multi-chip module that is testable and reconfigurable based on testing results

机译:用于基于测试结果可测试和可重新配置的多芯片模块的方法和装置

摘要

A method and apparatus for a multi-chip module that is testable and reconfigurable based on testing results is accomplished by a multi-chip module that includes a first circuit disposed on a first chip substrate, a second circuit disposed on second chip substrate, and an interconnecting substrate operably coupled to the first chip substrate and the second chip substrate. The interconnecting substrate connects the first circuit to the second circuit. The interconnecting substrate includes external connectors for accessing signals within the multi-chip module, which allow the multi-chip module to be fully tested. This testing may include isolating the first circuit and/or the second circuit by disabling other circuits in order to allow each of the circuits to be exercised without interference from other circuits. After testing the multi-chip module, configuration circuitry included on the multi-chip module may be used to reconfigure the multi-chip module based on results of the testing.
机译:一种基于测试结果的可测试和可重构的多芯片模块的方法和装置,其通过一种多芯片模块来实现,该多芯片模块包括:第一电路,其布置在第一芯片基板上;第二电路,其布置在第二芯片基板上;以及互连基板可操作地耦合到第一芯片基板和第二芯片基板。互连基板将第一电路连接到第二电路。互连基板包括用于访问多芯片模块内信号的外部连接器,这些外部连接器允许对多芯片模块进行全面测试。该测试可以包括通过禁用其他电路来隔离第一电路和/或第二电路,以允许每个电路被行使而不受其他电路的干扰。在测试多芯片模块之后,可以使用多芯片模块上包括的配置电路基于测试结果来重新配置多芯片模块。

著录项

  • 公开/公告号US6351681B1

    专利类型

  • 公开/公告日2002-02-26

    原文格式PDF

  • 申请/专利权人 ATI INTERNATIONAL SRL;

    申请/专利号US19980197720

  • 发明设计人 KEITH S. K. LEE;DAVID CHIH;LEE K. LAU;

    申请日1998-11-23

  • 分类号G06F190/00;G01R312/60;

  • 国家 US

  • 入库时间 2022-08-22 00:46:55

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