Test system for testing IC having IIC bus interface function and test method therefor

摘要

PURPOSE: A system and a method for testing IC equipping an IIC(Inter-Integrated Circuit) bus interfacing function are provided to reduce a test cost for testing an IC equipping IIC bus interfacing function by using a lower cost analog test apparatus. CONSTITUTION: The system comprises an MCU(Micro-Controller) application circuit(30) storing a test pattern for testing an IC and outputting the test pattern to the IC in an IIC bus interface pattern in response to a control signal and an analog test apparatus(20) generating an analog signal for testing the IC, displaying a test result and generating the control signal. The test signal uses a relay bit that is a supporting signal to control the relay when the analog test apparatus tests an analog IC. The control signal consists of an address bit and interrupt bit in order to appoint the address of ROM in the MCU application circuit.