Test system for testing IC having IIC bus interface function and test method therefor

摘要

A test system and test method for testing an integrated circuit (IC) having an IIC bus interface function is disclosed. The test system of the present invention includes microcontroller (MCU) application circuitry and analog test equipment. The MCU application circuit part stores a test pattern for testing the IC and outputs a specific test pattern in accordance with the IIC bus interface format in response to a predetermined control signal. The analog test equipment generates the analog signals required for the IC's test, displays the results of the test, and generates control signals to control the MCU application circuitry. The control signal is characterized by using a relay bit which is a signal that is supported by the analog test equipment to control the relay in testing of the analog integrated circuit. By adding a simple MCU application circuit to a conventional analog test device, the present invention can test an IC having an IIC bus interface function at a much lower cost than a digital test device.