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Electronic Components With Doped Metal Oxide Dielectric Materials And A Process For Making Electronic Components With Doped Metal Oxide Dielectric Materials

机译:掺杂金属氧化物介电材料的电子元件以及制备掺杂金属氧化物介电材料的电子元件的方法

摘要

It made of such a material and a doped metal oxide dielectric materials to electronic devices is disclosed. The metal oxide is a group III or group V metal oxides: a (for example, Al2O3, Y2O3, Ta2O5, or V2O5), and then the metal dopant is a group IV material (Zr, Si, Ti, Hf). Metal oxide and about 0.1 weight percent of 30 weight percent comprises a dopant. The metal oxide doped dielectric of the present invention can be used in many other electronic devices and apparatus. For example, a doped metal oxide dielectric is used as a gate dielectric for the MOS device. The metal oxide doped dielectric is also used as an inter-poly dielectric material for the flash memory device.
机译:公开了由这种材料和掺杂的金属氧化物介电材料制成的电子器件。金属氧化物是III族或V族金属氧化物:a(例如,Al 2 O 3,Y 2 O 3,Ta 2 O 5或V 2 O 5),然后金属掺杂剂是IV族材料(Zr,Si,Ti,Hf)。金属氧化物和30重量%的约0.1重量%构成掺杂剂。本发明的掺杂金属氧化物的电介质可以用于许多其他电子设备和装置中。例如,掺杂的金属氧化物电介质用作MOS器件的栅极电介质。掺杂有金属氧化物的电介质还用作闪存器件的多晶硅层间电介质材料。

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