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Micro Gyroscope Fabricated by Single-crystalline Silicon Micromachining Technology

机译:单晶硅微加工技术制造的微陀螺仪

摘要

The present invention relates to a micro-angerometer manufactured by a single crystal silicon micromachining technique, wherein an insulating film is formed by a process having good step coverage of the entire structure to be insulated among the micro-angerometer structures, and a conductive film having good step coverage is used on the insulating film. Forming a conductive film as a whole, using a triple layer of an insulating film / conductive film / metal film formed of a metal film formed on a portion of the conductive film using a metal having poor step coverage, and partially etching the conductive film of the triple film. The electrical insulation between the structures of the micro-angerometer is separated by the separation.;The microangular velocity meter manufactured by the single crystal silicon micromachining technique according to the present invention is an insulation method that can be applied even when the spacing between the microstructures is small and the aspect ratio is large by introducing an SBM process and an insulation process of an oxide film / polycrystalline silicon film / metal film. By using this, the capacitance of the structure is increased, resulting in a high resolution. In addition, after fabricating the microstructure, the width of the spring moving in the horizontal direction can be controlled by controlling the thickness of the polycrystalline silicon film and oxide film deposited or grown on the side of the structure in the insulation process, and the spring constant and The resonant frequency of the structure is adjustable at the process stage. As such, being able to adjust the capacitance and the mechanical properties in the middle of the process is a great advantage in increasing the yield in the mass production process. In addition, the microangular rateometer according to the present invention is a wet etching process for spring floating by causing the undercut phenomenon occurring in the silicon deep etching step due to the middle of the spring to make a hole, not only at both ends of the spring, but also in the hole formed in the middle. This has the advantage of reducing the time it takes.
机译:本发明涉及一种通过单晶硅微机械加工技术制造的微测距仪,其中,通过在该微测距仪结构之间对要被绝缘的整个结构具有良好的台阶覆盖率的工艺来形成绝缘膜,以及具有上述结构的导电膜在绝缘膜上使用了良好的台阶覆盖率。使用绝缘膜/导电膜/金属膜的三层整体形成导电膜,该绝缘膜/导电膜/金属膜是由金属膜形成的,该金属膜形成在导电膜的一部分上,使用阶梯覆盖率差的金属,并且部分蚀刻了三层胶卷。通过该间隔来分离微愤怒计的结构之间的电绝缘。通过根据本发明的单晶硅微机械加工技术制造的微角速度计是即使在微结构之间的间隔也可以应用的绝缘方法。通过引入SBM工艺和氧化膜/多晶硅膜/金属膜的绝缘工艺,其尺寸小且纵横比大。通过使用该结构,增加了结构的电容,导致高分辨率。另外,在制造微结构之后,可以通过控制在绝缘过程中沉积或生长在结构侧面上的多晶硅膜和氧化膜的厚度来控制在水平方向上移动的弹簧的宽度。常数和结构的共振频率在工艺阶段是可调的。因此,在过程的中间阶段能够调节电容和机械性能在提高批量生产过程中的成品率方面具有很大的优势。另外,根据本发明的微角速率计是一种湿式蚀刻工艺,其用于弹簧浮动,其不仅通过在弹簧的中部引起在硅深蚀刻步骤中发生的侧蚀现象而形成孔,不仅在弹簧的两端。弹簧,还可以在中间形成的孔中。这具有减少花费时间的优点。

著录项

  • 公开/公告号KR100332360B1

    专利类型

  • 公开/公告日2002-04-12

    原文格式PDF

  • 申请/专利权人 조동일;

    申请/专利号KR20000040121

  • 发明设计人 조동일;

    申请日2000-07-13

  • 分类号H01L29/84;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:48

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