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Thermal type infrared ray detector with thermal separation structure for high sensitivity

机译:具有热分离结构的热敏型红外线探测器,灵敏度高

摘要

The present invention relates to a thermal type infrared ray detector having a thermal separation structure comprising a plurality of picture elements. Each of the plurality of image elements includes a circuit formed in the substrate for all the image elements, and a light receiving unit for converting infrared rays into resistance change or charge quantity change. The circuit generates a voltage signal from the resistance change or the charge amount change. A beam mechanically supports the light receiving portion from the substrate to form a gap between the substrate and the light receiving portion, and electrically connects the light receiving portion to the circuit. The beams each include a wiring film formed of a Ti alloy to connect the light receiving unit to the circuit, and a protective insulating film surrounding the wiring film. In this case, the Ti alloy may be TiAl6V4.
机译:本发明涉及一种具有包括多个图像元素的热分离结构的热式红外线检测器。多个图像元件中的每一个包括形成在基板中的所有图像元件的电路,以及用于将红外线转换为电阻变化或电荷量变化的光接收单元。该电路根据电阻变化或电荷量变化生成电压信号。光束从基板机械地支撑光接收部分,以在基板和光接收部分之间形成间隙,并且将光接收部分电连接到电路。每个光束包括由Ti合金形成的配线膜,该配线膜将光接收单元连接到电路,以及围绕配线膜的保护绝缘膜。在这种情况下,Ti合金可以是TiAl6V4。

著录项

  • 公开/公告号KR100343869B1

    专利类型

  • 公开/公告日2002-07-20

    原文格式PDF

  • 申请/专利权人 닛폰 덴키(주);

    申请/专利号KR20000042647

  • 发明设计人 가와노가츠야;오다나오키;

    申请日2000-07-25

  • 分类号G01J1/42;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:35

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