首页> 外国专利> METHOD FOR FABRICATING QUANTUM DOT AND SINGLE ELECTRON MEMORY DEVICE USING THE QUANTUM DOT

METHOD FOR FABRICATING QUANTUM DOT AND SINGLE ELECTRON MEMORY DEVICE USING THE QUANTUM DOT

机译:利用量子点制造量子点和单电子存储器的方法

摘要

The present invention relates to a single electron memory device, and provides a method of manufacturing a quantum dot and a method of manufacturing a single electronic memory device. A method for manufacturing a quantum dot of a single electron memory device according to the present invention includes the steps of forming a first insulating layer on a semiconductor layer, forming a second insulating layer on the insulating layer, and patterning the second insulating layer. Forming a T " shape opening to partially expose the upper surface of the first insulating layer; and implanting silicon ions into the first insulating layer through the opening by using an inclination angle ion implantation method; And thermally recrystallizing the silicon ions implanted into the first insulating layer. In addition, the method of manufacturing a single-electron memory device according to the present invention may further include removing the second insulating layer after performing the step of manufacturing the quantum dots, and using a control gate electrode having a polysilicon layer pattern on the first insulating layer. And forming a source / drain region in the semiconductor layer on both sides of the control gate electrode, and forming the first insulating film with the same size as the control gate electrode.
机译:本发明涉及一种单电子存储器件,并提供一种制造量子点的方法和一种制造单电子存储器件的方法。根据本发明的用于制造单电子存储器件的量子点的方法包括以下步骤:在半导体层上形成第一绝缘层;在绝缘层上形成第二绝缘层;以及对第二绝缘层进行构图。形成T“形开口以部分地暴露第一绝缘层的上表面;并且通过使用倾斜角离子注入方法通过该开口将硅离子注入到第一绝缘层中;并且使注入到第一绝缘体中的硅离子热重结晶。另外,根据本发明的制造单电子存储器件的方法还可以包括:在执行制造量子点的步骤之后,去除第二绝缘层;以及在其上使用具有多晶硅层图案的控制栅电极。在控制栅电极的两侧的半导体层中形成源/漏区,并形成与控制栅电极相同尺寸的第一绝缘膜。

著录项

  • 公开/公告号KR100347146B1

    专利类型

  • 公开/公告日2002-08-03

    原文格式PDF

  • 申请/专利权人 주식회사 하이닉스반도체;

    申请/专利号KR20000051218

  • 发明设计人 김일권;

    申请日2000-08-31

  • 分类号H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-22 00:29:28

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