首页> 外国专利> SHALLOW TRENCH ISOLATION ON A SILICON SUBSTRATE USING NITROGEN IMPLANT INTO THE SIDE WALL

SHALLOW TRENCH ISOLATION ON A SILICON SUBSTRATE USING NITROGEN IMPLANT INTO THE SIDE WALL

机译:氮气注入侧墙的硅基质上的浅沟槽隔离

摘要

A method for manufacturing a tapered trench (tapered trench) on a silicon substrate, and forming the initial trench in the substrate, but injecting the nitrogen ions in the side walls of the initial trenches adjacent to the exposed surface of the substrate than the portion adjacent to the trench bottom comprising the steps of: more implanting nitrogen ions into a part, by oxidizing the side walls of the initial trenches comprises the steps of creating a tapered shape.
机译:一种用于在硅基板上制造锥形沟槽(锥形沟槽)并在基板中形成初始沟槽,但是将氮离子注入到邻近于基板的暴露表面而不是邻近部分的初始沟槽的侧壁中的方法。形成沟槽底部的步骤包括以下步骤:通过氧化初始沟槽的侧壁将更多的氮离子注入到部件中,包括形成锥形的步骤。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号