首页> 外国专利> / Optical pickup apparatus for capable of detecting thickness variation of recording medium and/or compensating spherical abberation generated by thickness variation thereof

/ Optical pickup apparatus for capable of detecting thickness variation of recording medium and/or compensating spherical abberation generated by thickness variation thereof

机译:/光学拾取装置,其能够检测记录介质的厚度变化和/或补偿由于其厚度变化而产生的球面像差

摘要

Light splitting-detecting means for detecting the light beam reflected from the recording medium and passing through the objective lens and the optical path converting means into a plurality of optical regions, the optical beam being reflected from the recording medium and passing through the objective lens and the optical path converting means. Comprising a light detector or a light splitting device provided to divide / detect in consideration of the change in the amount of light distribution according to the thickness change of the light and a plurality of light detectors for receiving the light divided by each, and calculates the detection signal output from the light detector An optical pickup apparatus configured to detect a thickness change signal is disclosed. According to such an optical pickup apparatus, a change in thickness of the recording medium can be detected even in an optical system structure that does not include an astigmatism lens that causes astigmatism on the light-receiving side, and drives a spherical aberration correcting element or collimating lens along the optical axis. An actuator is further provided, and when the spherical aberration correcting element is driven by the detected thickness change signal, or the collimating lens is driven along the optical axis, spherical aberration caused by the thickness change of the recording medium can be corrected.
机译:分光检测装置,用于检测从记录介质反射并通过物镜的光束,以及光路转换装置进入多个光学区域,光束从记录介质反射并通过物镜,并且光路转换装置。包括光检测器或分光装置,该光检测器或分光装置设置成考虑到根据光的厚度变化的光分布量的变化来进行分光/检测,并且包括多个光接收器,该光检测器或光分离装置用于接收由每个光检测器划分的光检测器。从光检测器输出的检测信号公开了一种构造为检测厚度变化信号的光学拾取装置。根据这样的光学拾取装置,即使在不包括在受光侧引起像散并驱动球面像差校正元件的像散透镜的光学系统结构中,也可以检测出记录介质的厚度变化。沿光轴准直透镜。进一步提供致动器,并且当由检测到的厚度变化信号驱动球面像差校正元件,或者沿着光轴驱动准直透镜时,可以校正由记录介质的厚度变化引起的球面像差。

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