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DRAM checking method for quality inspection, involves storing test results in non-volatile memory area of DRAM
DRAM checking method for quality inspection, involves storing test results in non-volatile memory area of DRAM
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机译:用于质量检查的DRAM检查方法,涉及将测试结果存储在DRAM的非易失性存储区中
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摘要
A non-volatile electrically programmable memory area (2) is provided in the DRAM (1). The DRAM is tested and the test results are stored in the memory area (2). An Independent claim is also included for a component with memory for testing.
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