首页> 外国专利> Multilayer contact system comprises a contact metallization deposited on a semiconductor substrate, a barrier layer deposited on the metallization, a bond metallization, and a protective metallization made from composite material

Multilayer contact system comprises a contact metallization deposited on a semiconductor substrate, a barrier layer deposited on the metallization, a bond metallization, and a protective metallization made from composite material

机译:多层接触系统包括沉积在半导体衬底上的接触金属,沉积在金属上的阻挡层,键合金属和由复合材料制成的保护性金属

摘要

Multilayer contact system comprises a contact metallization deposited on a semiconductor substrate; a barrier layer deposited on the metallization to prevent interdiffusion processes; a bond metallization with a bond pad deposited on the barrier layer; and a protective metallization made from composite material of chromium and precious metal or a chromium-precious metal alloy. Preferred Features: The bond pad is laterally displaced against the vertical contact structure. The region is protected with a passivation outside of the bond pads. The contact metallization is deposited in a contact structure etched into a SiO2 layer.
机译:多层接触系统包括沉积在半导体衬底上的接触金属;沉积在金属上的阻挡层,以防止相互扩散过程;用沉积在阻挡层上的键合焊盘进行键合金属化;由铬和贵金属或铬贵金属合金的复合材料制成的保护金属。优选特征:焊盘相对于垂直接触结构横向移位。该区域通过焊盘外部的钝化保护。接触金属化层以蚀刻成SiO2层的接触结构沉积。

著录项

  • 公开/公告号DE10062399A1

    专利类型

  • 公开/公告日2002-06-20

    原文格式PDF

  • 申请/专利权人 DAIMLERCHRYSLER AG;

    申请/专利号DE2000162399

  • 发明设计人 OECHSNER HANS;GETTO RALF;FREYTAG JUERGEN;

    申请日2000-12-14

  • 分类号H01L23/522;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:16

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