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Correction method and image signal defect detection and correction device and imaging signal defect detection

机译:校正方法,图像信号缺陷检测校正装置以及成像信号缺陷检测

摘要

PURPOSE:To reduce uncorrected defective parts in image pickup signals by efficiently utilizing the memory capacity of a memory means for storing defect address data used for detecting defective picture elements in respective plural image pickup surface formation parts and specifying positions. CONSTITUTION:This device is provided with a defect detection part 35 for detecting the defective parts based on the defective picture elements in the image pickup signals obtained from the three image pickup surface formation parts 10R, 10G and 10B, an identification data formation part for obtaining identification data for specifying the image pickup signals for which the defective parts are detected, a defect data storage part for storing the defect address data corresponding to the defective picture elements in the image pickup surface formation parts 10R, 10G and 10B relating to the formation of the image pickup signals for which the defective parts are detected in a data memory part corresponding to the identification data and a control signal formation part for obtaining defect correction instruction signals based on the defect address data and the identification data read from the data memory part.
机译:用途:通过有效利用存储装置的存储容量来减少图像拾取信号中的未校正缺陷部分,该存储装置用于存储缺陷地址数据,该缺陷地址数据用于检测各个图像拾取表面形成部分中的缺陷像素并指定位置。构成:该设备设有缺陷检测部分35,用于基于从三个图像拾取表面形成部分10R,10G和10B获得的图像拾取信号中的缺陷像素检测缺陷部分,该识别数据形成部分用于获得识别数据用于指定检测到缺陷部分的图像拾取信号,缺陷数据存储部分用于在与图像形成表面有关的图像拾取表面形成部分10R,10G和10B中存储与缺陷像素相对应的缺陷地址数据。在对应于识别数据的数据存储部分中检测到缺陷部分的图像拾取信号和用于基于从数据存储部分读取的缺陷地址数据和识别数据获得缺陷校正指令信号的控制信号形成部分。

著录项

  • 公开/公告号JP3409425B2

    专利类型

  • 公开/公告日2003-05-26

    原文格式PDF

  • 申请/专利权人 ソニー株式会社;

    申请/专利号JP19940088049

  • 发明设计人 志村 雅之;

    申请日1994-04-03

  • 分类号H04N5/335;H04N9/07;

  • 国家 JP

  • 入库时间 2022-08-22 00:21:12

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