首页> 外国专利> EARLY DELAY ANALYSIS SYSTEM IN HIERARCHICAL LAYOUT AND DELAY ANALYSIS PROGRAM

EARLY DELAY ANALYSIS SYSTEM IN HIERARCHICAL LAYOUT AND DELAY ANALYSIS PROGRAM

机译:分层布局中的早期延迟分析系统和延迟分析程序

摘要

PROBLEM TO BE SOLVED: To perform delay analysis before completion of the entire layout of an LSI (large-scale integrated circuit).;SOLUTION: An early delay analysis system in hierarchical layout comprises an RC merge/hierarchical development means 21 for outputting the entire chip net list 13 formed by merging RC information of a net extending over a macro boundary from a low-order hierarchy net list 12 and a top net list 12 including macro circuit information, approximate wiring information and its RC information, performing macro development and eliminating macro hierarchy, a delay information generation means 22 for outputting wiring delay and gate delay information 15 by every net by referring to a primitive block delay library 14 and a delay analysis means 23 for inputting the delay information 15, the entire chip net list 13 and delay restriction information 16 and for outputting frequency distribution statistical information by every delay restriction violation path and violation value as delay analysis information 17.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:在完成LSI(大规模集成电路)的整个布局之前执行延迟分析。;解决方案:分层布局的早期延迟分析系统包括RC合并/分层开发装置21,用于输出整个电路。通过合并从低阶层次网络列表12和顶部网络列表12合并在宏边界上延伸的网络的RC信息而形成的芯片网络列表13,包括宏电路信息,近似布线信息及其RC信息,进行宏开发并消除在宏层次结构中,通过参考原始块延迟库14按每个网络输出布线延迟和栅极延迟信息15的延迟信息生成装置22,以及用于输入延迟信息15的延迟分析装置23,整个芯片网络列表13和延迟限制信息16,用于通过每个延迟限制违反路径和违反来输出频率分布统计信息n值作为延迟分析信息17 .;版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP2003296392A

    专利类型

  • 公开/公告日2003-10-17

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP20020103678

  • 发明设计人 ONO KOKI;

    申请日2002-04-05

  • 分类号G06F17/50;H01L21/82;

  • 国家 JP

  • 入库时间 2022-08-22 00:20:29

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