首页> 外国专利> METHOD AND APPARATUS FOR SEPARATING/CLEANING OF WAFERLIKE WORK

METHOD AND APPARATUS FOR SEPARATING/CLEANING OF WAFERLIKE WORK

机译:沃弗里克作品的分离/清洁方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a technique by which wafers adhered to each other at a sliced stage can be separated and cleaned easily and simply.;SOLUTION: The separating and cleaning apparatus is constituted in such a way that a wafer material 1 is fixed and bonded to a block B, that the wafer blank 1 is sliced to form each waferlike work W and that respective wafers 2 formed by its slicing operation are separated from each other by a separation means 5 so as to be cleaned. The apparatus is constituted in such a way that a flow channel 6 for a cleaning liquid Q is installed in the block B, that the wafer material 1 is sliced, that each sliced gap S in the wafer material 1 is made to communicate with the flow channel 6 for the cleaning liquid Q and that the cleaning liquid Q can be circulated in each sliced gap S.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种技术,通过该技术可以容易且简单地分离和切割在切片阶段粘附在一起的晶片。解决方案:分离和清洁设备的构成应固定晶片材料1然后,将晶片毛坯1切成每个晶片状工件W,并把由其切片操作形成的各个晶片2通过分离装置5彼此分离并清洗,并粘结到块B上。该设备以如下方式构成:在块B中安装用于清洗液Q的流道6,对晶片材料1进行切片,使晶片材料1中的每个切片间隙S与流连通。清洁液Q的通道6,并且清洁液Q可以在每个切片间隙S中循环。;版权所有:(C)2003,JPO

著录项

  • 公开/公告号JP2003100667A

    专利类型

  • 公开/公告日2003-04-04

    原文格式PDF

  • 申请/专利权人 ITEC CO LTD;

    申请/专利号JP20010295684

  • 发明设计人 MATSUOKA ISANORI;IRIE MAKIO;

    申请日2001-09-27

  • 分类号H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-22 00:20:15

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