首页> 外国专利> INSTRUMENT FOR MEASURING APPLIED THICKNESS, CONTAMINATED STATE, ETC., OF SO-CALLED RESIN WAX, PAINT, ETC., APPLIED TO FLOOR AND METHOD OF MAINTAINING AND MANAGING FINE VIEW OF FLOOR USING IT

INSTRUMENT FOR MEASURING APPLIED THICKNESS, CONTAMINATED STATE, ETC., OF SO-CALLED RESIN WAX, PAINT, ETC., APPLIED TO FLOOR AND METHOD OF MAINTAINING AND MANAGING FINE VIEW OF FLOOR USING IT

机译:涂在地板上的经评定的树脂蜡的适用厚度(被污染状态等)的测量厚度的方法以及使用该方法维护和管理地板细观的方法

摘要

PROBLEM TO BE SOLVED: To provide a method by which the fine view of a floor can be maintained and managed efficiently by easily measuring the thickness, contamination, etc., of wax applied to the floor in the course of building management.;SOLUTION: In this method, the floor of a building is maintained effectively by managing the contaminated state of the floor by measuring the thickness of paint, wax, etc., applied to a marker chip made of iron or an electromagnetism transmitting material and stuck to the floor by means of an electromagnetic thicknessmeter and the contaminated state of the paint, wax, etc., by means of a colorimeter, lightness meter, etc. In addition, post-maintenance evaluation can be performed concretely.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提供一种方法,通过在建筑物管理过程中轻松测量涂在地板上的蜡的厚度,污染程度等,可以有效地维护和管理地板的美观。在这种方法中,通过测量涂料,蜡等的厚度来管理地板的污染状态,从而有效地维护建筑物的地板,这些涂料,蜡等的厚度适用于铁或电磁传输材料制成的标记芯片并粘在地板上借助电磁测厚仪和油漆,蜡等的污染状态,借助比色计,亮度计等。此外,可以具体进行后期维护评估。;版权:(C)2003,日本特许厅

著录项

  • 公开/公告号JP2003177003A

    专利类型

  • 公开/公告日2003-06-27

    原文格式PDF

  • 申请/专利权人 MANRYU:KK;

    申请/专利号JP20010402682

  • 发明设计人 FUJIWARA HIROAKI;

    申请日2001-12-12

  • 分类号G01B7/06;B05D3/00;G01B11/30;

  • 国家 JP

  • 入库时间 2022-08-22 00:17:27

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