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Light - voltage conversion type semiconductor light receiving element, optical signal processing device and an optical integrated device

机译:光电压转换型半导体光接收元件,光信号处理装置和光集成装置

摘要

PROBLEM TO BE SOLVED: To realize a semiconductor photo detecting element of high speed and efficiency which needs no external power source. SOLUTION: A doping dipole structure constituted of an N-type high density delta doped layer 132 and a P-type high density delta doped layer 131 which are adjacent to each other at most 20 nm is periodically formed in an undoped layer 133 which is to be irradiated with a light, thereby turning the band structure of a light absorbing layer into a sawtooth type. When the undoped layer 133 is irradiated with a light, a photo carrier is drifted by the sawtooth type band structure, collected in the doping dipole structure region, and a large electromotive force is generated by direct recombination and indirect recombination. As the result, high response and high efficiency can be made compatible with each other, so that a semiconductor photo detecting element which generates a signal voltage in the element and needs no external power source can be provided. An optical integrated element in which a semiconductor photo detecting element is arranged on the same substrate, and an optical communication and measuring device mounting the elements can be obtained.
机译:要解决的问题:实现不需要外部电源的高速高效的半导体光电检测元件。解决方案:在不掺杂层133中周期性地形成由彼此相邻的N型高密度δ掺杂层132和P型高密度δ掺杂层131构成的掺杂偶极结构,该掺杂层周期为20nm。用光照射,从而使光吸收层的能带结构变成锯齿形。当未掺杂层133被光照射时,光载波因锯齿形带结构而漂移,聚集在掺杂偶极结构区域中,并且通过直接复合和间接复合产生大的电动势。结果,可以使高响应和高效率彼此兼容,从而可以提供在该元件中产生信号电压并且不需要外部电源的半导体光电检测元件。可以得到在同一基板上配置有半导体光检测元件的光集成元件,以及搭载该元件的光通信测定装置。

著录项

  • 公开/公告号JP3365329B2

    专利类型

  • 公开/公告日2003-01-08

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP19990014942

  • 发明设计人 牧田 紀久夫;

    申请日1999-01-22

  • 分类号H01L31/10;G02F1/015;

  • 国家 JP

  • 入库时间 2022-08-22 00:17:15

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