EMBEDDED MEMORY OF ASIC AND BUILT-IN SELF-TESTING METHOD USING PROCESSOR

摘要

PROBLEM TO BE SOLVED: To provide an analog-digital converting method and a device suitable for an automatic testing device.;SOLUTION: This testing method of ASIC (application specific integrated circuit 100 executes a test routine 128 in an incorporated memory 120 or an external memory by using an incorporated processor 110 in the ASIC. When manufacturing the ASIC, the test routine can execute a wide test of an ASIC block without receiving supply of a complicated test pattern from the testing device. The test routine can execute a highly functional test in a system and the final product including the ASIC. Selection, activation, and result output of the test are provided by using several terminals of the ASIC.;COPYRIGHT: (C)2003,JPO