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METHOD OF MEASURING CHARACTERISTIC DATA RELATING TO MULTILEVEL OPTICAL RECORDING MEDIUM AND EVALUATION METHOD RELATING TO MULTILEVEL OPTICAL RECORDING MEDIUM

机译:与多级光学记录介质有关的特征数据的测量方法和与多级光学记录介质有关的评估方法

摘要

PROBLEM TO BE SOLVED: To provide a method of measuring the character data relating to a multilevel optical recording medium capable of reducing a measuring cost. ;SOLUTION: The measuring method of measuring the characteristic data relating to the multilevel optical recording medium manufactured in such a manner that multilevel recording is possible comprises measuring the characteristic data relating to the multilevel optical recording medium by using an apparatus for evaluating binary recording and reproducing (steps 31 to 33). As a result, the characteristic data relating to the multilevel optical recording medium can be measured without freshly purchasing or manufacturing an apparatus for evaluating multilevel recording and reproducing to be exclusively used and therefore the measuring cost thereof can be reduced.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种测量与多层光学记录介质有关的字符数据的方法,该方法能够降低测量成本。 ;解决方案:一种测量可能以多级记录方式制造的与多级光学记录介质有关的特性数据的测量方法,包括通过使用一种用于评估二进制记录和再现的设备来测量与多级光学记录介质有关的特性数据。 (步骤31至33)。结果,可以测量与多层光学记录介质有关的特性数据,而不必新鲜购买或制造专用于评估多层记录和再现的设备,因此可以降低其测量成本。版权:(C) 2003年

著录项

  • 公开/公告号JP2002367237A

    专利类型

  • 公开/公告日2002-12-20

    原文格式PDF

  • 申请/专利权人 TDK CORP;

    申请/专利号JP20010169908

  • 申请日2001-06-05

  • 分类号G11B7/26;G11B7/0045;G11B7/24;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:14

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